The Rigaku SmartLab is a multipurpose high resolution X-ray diffractometer (HRXRD) automated with SmartLab Studio II software. The system is equipped with a Monochromator in the diffracted beam side and uses Converging Beam Optics (CBO) technology for fully automated beam alignment. It supports multiple XRD applications including powder diffraction, thin film metrology, SAXS, in-plane scattering, micro diffraction, capillary measurements, texture and pole figure, and X-ray reflectometry. The SmartLab Studio II software provides intelligent user guidance and performs automated phase/composition identification, qualitative and quantitative analysis, residual stress analysis, Rietveld analysis, and thin-film analysis.

Key Features

• X-Ray Source: 3 kW; Cu Kα X-Ray radiation
• Goniometer Type: High resolution θ/θ closed loop goniometer
• X-Ray Beam Optics: Converging Beam Optics (CBO) technology
• Detector: High resolution HyPix-3000 semiconductor detector
• Measurement Modes: 0D and 1D modes with/without Monochromator

XRD Applications:

• Powder diffraction measurement
• Thin film metrology (Gracing incidence XRD – GI-XRD)
• SAXS (polymers and gels)
• In-plane scattering
• Micro diffraction
• Capillary method measurement
• Texture and pole figure
• X-ray reflectometry

XRD Data Analysis:

• Phase/Composition identification
• Qualitative and Quantitative analysis
• Residual stress analysis
• Rietveld analysis
• Thin-film analysis

Suitable for a broad range of XRD analyses from powder diffraction to advanced thin-film characterization with automated alignment and analysis tools.