Scanning Probe Microscope

Scanning Probe Microscope Laboratory has two SPM systems with one controller (Nanoscope V). Hence, only one system is operated at a time. The SPM system has a number of modes to explore surface properties of materials.

Available modes of operation, features and accessories:

STM    CAFM    EC-STM
AFM    SCM    EC-AFM
MFM    PFM    Nanoindentation
LFM/FFM    SP Nanolithography
FMM    Temperature Variation    Nano-Scratching
SSRM    STHM    Spectroscopic Techniques
EFM    AFM in liquid environment    Signal Access Module

The key features of SPM includes:

Property    Dimension Icon    Multimode 8
Scan area: ≤ 90 μm × 90 μm    ≤ 10 μm × 10 μm
Roughness (Z scale) variation: ≤ 10 μm    ≤ 2.5 μm
Scanner nonlinearity: less than 0.5%    less than 0.5%
Sample size (Diameter): ≤ 210 mm (with vacuum chuck)    ≤ 15 mm
Sample size (Thickness): ≤ 15 mm    ≤ 5 mm
Resolution (AFM)-Lateral: 1 Å    1 Å
Resolution (AFM)-Spatial: 0.5 Å    0.3 Å
Nanoindentation-Top: Berkovich type, Diamond    Berkovich type, Diamond
Nanoindentation-Load: ≤ 260 μN    ≤ 260 μN
Image size: ≤ 5120 pixel × 5120 pixel    ≤ 5120 pixel × 5120 pixel
View Optics: Display and capture 180 μm to 1465 μm, 5 Mega-pixel    Display and capture 180 μm to 1465 μm, 5 Mega-pixel

Instrument Status: Running

Analysis Charge: Click Here