The Rigaku Primus IV Wavelength Dispersive X-Ray Fluorescence (WDXRF) spectrometer enables precise elemental analysis of solids, liquids, powders, alloys, and thin films. The system features a tube-above optical design that minimizes contamination and is ideal for high-sensitivity, quantitative, and qualitative elemental analysis. It offers versatility through its advanced hardware and software options, including mapping and microanalysis capabilities.

Technical Specifications

• Make: Rigaku
• Model: Primus IV
• Benefit: Elemental analysis of solids, liquids, powders, alloys, and thin films
• Technology: Tube-above sequential wavelength dispersive (WDXRF)
• Core Attributes: 3/4 kW sealed X-ray tube, 48-position auto sampler, Be to U, vacuum
• Core Options: He-flush, additional analyzing crystals, r-θ stage/mapping
• Dimensions: 1310 (W) × 1470 (H) × 890 (D) mm
• Power Requirements: 1Ø, 200 VAC, 50/60 Hz, 8 kW

Key Features

• Analysis of elements from Be to U
• ZSX Guidance expert system software
• Tube-above optics minimize contamination issues
• Compact design uses less valuable lab space
• Microanalysis for samples as small as 500 µm
• 30μ X-ray tube for superior light element performance
• Mapping feature for elemental topography and distribution

Sample Preparation Facilities:

• Press pellet preparation for powdered samples < 200 mesh is available

Ideal for laboratories requiring accurate elemental analysis of diverse sample types, from bulk materials to thin films.