Scanning Probe Microscope
- Make: Bruker Corporation
- Model: Dimension Icon and MultiMode 8
- Faculty-in-Charge: Prof. A. K. Kar
- Email: spm_crf@iitism.ac.in
- Phone: 0326-223-5403
Scanning Probe Microscope Laboratory has two SPM systems with one controller (Nanoscope V). Hence, only one system is operated at a time. The SPM system has a number of modes to explore surface properties of materials.
Available modes of operation, features and accessories:
STM CAFM EC-STM
AFM SCM EC-AFM
MFM PFM Nanoindentation
LFM/FFM SP Nanolithography
FMM Temperature Variation Nano-Scratching
SSRM STHM Spectroscopic Techniques
EFM AFM in liquid environment Signal Access Module
The key features of SPM includes:
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Property Dimension Icon Multimode 8
Scan area: ≤ 90 μm × 90 μm ≤ 10 μm × 10 μm
Roughness (Z scale) variation: ≤ 10 μm ≤ 2.5 μm
Scanner nonlinearity: less than 0.5% less than 0.5%
Sample size (Diameter): ≤ 210 mm (with vacuum chuck) ≤ 15 mm
Sample size (Thickness): ≤ 15 mm ≤ 5 mm
Resolution(AFM)-Lateral 1 Å 1 Å
Resolution(AFM)-Spatial 0.5 Å 0.3 Å
Nanoindentation-Top : Berkovich type, Diamond Berkovich type, Diamond
Nanoindentation-Load : ≤ 260 μN ≤ 260 μN
Image size : ≤ 5120 pixel × 5120 pixel ≤ 5120 pixel × 5120 pixel
View Optics: Display and capture 180 μm to 1465 μm, 5 Mega-pixel 180 μm to 1465 μm, 5 Mega-pixel